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qiu ye yu
(24 results)?
Deep-learning-based deflectometry for freeform surface measurement.
Opt Lett. 2022 Jan 1;47(1):78-81. doi: 10.1364/OL.447006.
Opt Lett. 2022.
PMID: 34951885
The effect of defect size on the quantitative estimation of defect depth using sonic infrared imaging.
Obeidat O, Yu Q, Favro L, Han X.
Obeidat O, et al. Among authors: yu q.
Rev Sci Instrum. 2019 May;90(5):054902. doi: 10.1063/1.5078380.
Rev Sci Instrum. 2019.
PMID: 31153268
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