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Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy.
Nanoscale Res Lett. 2018 May 8;13(1):139. doi: 10.1186/s11671-018-2536-z.
Nanoscale Res Lett. 2018.
PMID: 29740776
Free PMC article.
Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy.
Ponomaryov SS, Yukhymchuk VO, Lytvyn PM, Valakh MY.
Ponomaryov SS, et al. Among authors: lytvyn pm.
Nanoscale Res Lett. 2016 Dec;11(1):103. doi: 10.1186/s11671-016-1308-x. Epub 2016 Feb 24.
Nanoscale Res Lett. 2016.
PMID: 26909783
Free PMC article.
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