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Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM.
Micromachines (Basel). 2022 Jun 19;13(6):971. doi: 10.3390/mi13060971.
Micromachines (Basel). 2022.
PMID: 35744586
Free PMC article.
Optimal Method for Test and Repair Memories Using Redundancy Mechanism for SoC.
Alnatheer S, Ahmed MA.
Alnatheer S, et al. Among authors: ahmed ma.
Micromachines (Basel). 2021 Jul 10;12(7):811. doi: 10.3390/mi12070811.
Micromachines (Basel). 2021.
PMID: 34357221
Free PMC article.
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