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Page 1
Standards for the Characterization of Endurance in Resistive Switching Devices.
ACS Nano. 2021 Nov 23;15(11):17214-17231. doi: 10.1021/acsnano.1c06980. Epub 2021 Nov 3.
ACS Nano. 2021.
PMID: 34730935
Free article.
Review.
Thermal Characterization of Conductive Filaments in Unipolar Resistive Memories.
Aguilera-Pedregosa C, Maldonado D, González MB, Moreno E, Jiménez-Molinos F, Campabadal F, Roldán JB.
Aguilera-Pedregosa C, et al. Among authors: gonzalez mb.
Micromachines (Basel). 2023 Mar 10;14(3):630. doi: 10.3390/mi14030630.
Micromachines (Basel). 2023.
PMID: 36985037
Free PMC article.
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