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michael hoek
(4 results)?
Single Photon Counting UV Solar-Blind Detectors Using Silicon and III-Nitride Materials.
Sensors (Basel). 2016 Jun 21;16(6):927. doi: 10.3390/s16060927.
Sensors (Basel). 2016.
PMID: 27338399
Free PMC article.
Review.
Characterization of the Percival detector with soft X-rays.
Marras A, Correa J, Lange S, Vardanyan V, Gerhardt T, Kuhn M, Krivan F, Shevyakov I, Zimmer M, Hoesch M, Bagschik K, Scholz F, Guerrini N, Marsh B, Sedgwick I, Cautero G, Giuressi D, Iztok G, Menk RH, Scarcia M, Stebel L, Nicholls T, Nichols W, Pedersen UK, Shikhaliev P, Tartoni N, Hyun H, Kim S, Kim K, Rah S, Dawiec A, Orsini F, Pinaroli G, Greer A, Aplin S, Jewell AD, Jones TJ, Nikzad S, Hoenk ME, Okrent F, Graafsma H, Wunderer CB.
Marras A, et al. Among authors: hoenk me.
J Synchrotron Radiat. 2021 Jan 1;28(Pt 1):131-145. doi: 10.1107/S1600577520013958. Epub 2021 Jan 1.
J Synchrotron Radiat. 2021.
PMID: 33399562
Free PMC article.
Item in Clipboard
Metal-dielectric filters for solar-blind silicon ultraviolet detectors.
Hennessy J, Jewell AD, Hoenk ME, Nikzad S.
Hennessy J, et al. Among authors: hoenk me.
Appl Opt. 2015 Apr 10;54(11):3507-12. doi: 10.1364/AO.54.003507.
Appl Opt. 2015.
PMID: 25967344
Item in Clipboard
Surface Passivation by Quantum Exclusion: On the Quantum Efficiency and Stability of Delta-Doped CCDs and CMOS Image Sensors in Space.
Hoenk ME, Jewell AD, Kyne G, Hennessy J, Jones T, Shapiro C, Bush N, Nikzad S, Morris D, Lawrie K, Skottfelt J.
Hoenk ME, et al.
Sensors (Basel). 2023 Dec 15;23(24):9857. doi: 10.3390/s23249857.
Sensors (Basel). 2023.
PMID: 38139703
Free PMC article.
Item in Clipboard
Delta-doped electron-multiplied CCD with absolute quantum efficiency over 50% in the near to far ultraviolet range for single photon counting applications.
Nikzad S, Hoenk ME, Greer F, Jacquot B, Monacos S, Jones TJ, Blacksberg J, Hamden E, Schiminovich D, Martin C, Morrissey P.
Nikzad S, et al. Among authors: hoenk me.
Appl Opt. 2012 Jan 20;51(3):365-9. doi: 10.1364/AO.51.000365.
Appl Opt. 2012.
PMID: 22270664
Free article.
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Ultraviolet antireflection coatings for use in silicon detector design.
Hamden ET, Greer F, Hoenk ME, Blacksberg J, Dickie MR, Nikzad S, Martin DC, Schiminovich D.
Hamden ET, et al. Among authors: hoenk me.
Appl Opt. 2011 Jul 20;50(21):4180-8. doi: 10.1364/AO.50.004180.
Appl Opt. 2011.
PMID: 21772406
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A system and methodologies for absolute quantum efficiency measurements from the vacuum ultraviolet through the near infrared.
Jacquot BC, Monacos SP, Hoenk ME, Greer F, Jones TJ, Nikzad S.
Jacquot BC, et al. Among authors: hoenk me.
Rev Sci Instrum. 2011 Apr;82(4):043102. doi: 10.1063/1.3574220.
Rev Sci Instrum. 2011.
PMID: 21528990
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