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Year | Number of Results |
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2013 | 2 |
2016 | 2 |
2024 | 1 |
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Page 1
Noise in NC-AFM measurements with significant tip-sample interaction.
Beilstein J Nanotechnol. 2016 Dec 1;7:1885-1904. doi: 10.3762/bjnano.7.181. eCollection 2016.
Beilstein J Nanotechnol. 2016.
PMID: 28144538
Free PMC article.
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy.
Lübbe J, Temmen M, Rode S, Rahe P, Kühnle A, Reichling M.
Lübbe J, et al. Among authors: temmen m.
Beilstein J Nanotechnol. 2013;4:32-44. doi: 10.3762/bjnano.4.4. Epub 2013 Jan 17.
Beilstein J Nanotechnol. 2013.
PMID: 23400758
Free PMC article.
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Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection Algorithms.
Gundler C, Temmen M, Gulberti A, Pötter-Nerger M, Ückert F.
Gundler C, et al. Among authors: temmen m.
Sensors (Basel). 2024 Apr 24;24(9):2688. doi: 10.3390/s24092688.
Sensors (Basel). 2024.
PMID: 38732794
Free PMC article.
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Determining cantilever stiffness from thermal noise.
Lübbe J, Temmen M, Rahe P, Kühnle A, Reichling M.
Lübbe J, et al. Among authors: temmen m.
Beilstein J Nanotechnol. 2013 Mar 28;4:227-33. doi: 10.3762/bjnano.4.23. Print 2013.
Beilstein J Nanotechnol. 2013.
PMID: 23616942
Free PMC article.
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Understanding interferometry for micro-cantilever displacement detection.
von Schmidsfeld A, Nörenberg T, Temmen M, Reichling M.
von Schmidsfeld A, et al. Among authors: temmen m.
Beilstein J Nanotechnol. 2016 Jun 10;7:841-51. doi: 10.3762/bjnano.7.76. eCollection 2016.
Beilstein J Nanotechnol. 2016.
PMID: 27547601
Free PMC article.
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