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Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL.
J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):204-213. doi: 10.1107/S1600577517015703. Epub 2018 Jan 1.
J Synchrotron Radiat. 2018.
PMID: 29271769
Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling.
Tholapi R, Gallard M, Burle N, Guichet C, Escoubas S, Putero M, Mocuta C, Richard MI, Chahine R, Sabbione C, Bernard M, Fellouh L, Noé P, Thomas O.
Tholapi R, et al. Among authors: gallard m.
Nanomaterials (Basel). 2020 Jun 26;10(6):1247. doi: 10.3390/nano10061247.
Nanomaterials (Basel). 2020.
PMID: 32604948
Free PMC article.
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