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Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon.
Ultramicroscopy. 2022 Mar;233:113458. doi: 10.1016/j.ultramic.2021.113458. Epub 2021 Dec 14.
Ultramicroscopy. 2022.
PMID: 34929560
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon.
Zhang Y, Kong C, Davidsen RS, Scardera G, Duan L, Khoo KT, Payne DNR, Hoex B, Abbott M.
Zhang Y, et al. Among authors: abbott m.
Ultramicroscopy. 2020 Nov;218:113084. doi: 10.1016/j.ultramic.2020.113084. Epub 2020 Jul 29.
Ultramicroscopy. 2020.
PMID: 32745881
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Application and validity of the effective medium approximation to the optical properties of nano-textured silicon coated with a dielectric layer.
Fung TH, Veeken T, Payne D, Veettil B, Polman A, Abbott M.
Fung TH, et al. Among authors: abbott m.
Opt Express. 2019 Dec 23;27(26):38645-38660. doi: 10.1364/OE.27.038645.
Opt Express. 2019.
PMID: 31878628
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