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Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model.
Sensors (Basel). 2022 Dec 2;22(23):9400. doi: 10.3390/s22239400.
Sensors (Basel). 2022.
PMID: 36502102
Free PMC article.
Unsupervised anomaly detection of MEMS in low illumination based on polarimetric Support Vector Data Description.
Huang Y, Sang M, Xing L, Hu H, Liu T.
Huang Y, et al. Among authors: xing l.
Opt Express. 2021 Oct 25;29(22):35651-35663. doi: 10.1364/OE.438564.
Opt Express. 2021.
PMID: 34808995
Free article.
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