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2003 | 1 |
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Surface displacement imaging by interferometry with a light emitting diode.
Appl Opt. 2002 Aug 20;41(24):4996-5001. doi: 10.1364/ao.41.004996.
Appl Opt. 2002.
PMID: 12206206
Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique.
Grauby S, Dilhaire S, Jorez S, Lopez LD, Rampnoux JM, Claeys W.
Grauby S, et al. Among authors: lopez ld.
Appl Opt. 2003 Apr 1;42(10):1763-8. doi: 10.1364/ao.42.001763.
Appl Opt. 2003.
PMID: 12683753
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