Measurement of nanometric displacements by correlating two speckle interferograms

Lucas P Tendela; Gustavo E Galizzi; Alejandro Federico; Guillermo H Kaufmann

doi:10.1364/AO.50.001758

Measurement of nanometric displacements by correlating two speckle interferograms

Appl Opt. 2011 Apr 20;50(12):1758-64. doi: 10.1364/AO.50.001758.

Authors

Lucas P Tendela¹, Gustavo E Galizzi, Alejandro Federico, Guillermo H Kaufmann

Affiliation

¹ Instituto de Física Rosario, Blvd. 27 de Febrero 210 bis, S2000EZP Rosario, Argentina. tendela@ifir‐conicet.gov.ar

PMID: 21509068
DOI: 10.1364/AO.50.001758

Abstract

This paper presents a method to measure nanometric displacement fields using digital speckle pattern interferometry, which can be applied when the generated correlation fringes show less than one complete fringe. The method is based on the evaluation of the correlation between the two speckle interferograms generated by both deformation states of the object. The performance of the proposed method is analyzed using computer-simulated speckle interferograms. A comparison with the performance given by a phase-shifting technique is also presented, and the advantages and limitations of the proposed method are discussed. Finally, the performance of the proposed method to process real data is illustrated.