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lin chun gao
(5 results)?
Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs.
Micromachines (Basel). 2023 Mar 4;14(3):602. doi: 10.3390/mi14030602.
Micromachines (Basel). 2023.
PMID: 36985009
Free PMC article.
Analysis of Degradation of Electromigration Reliability of Au-Al and OPM Wire Bonded Contacts at 250 °C Using Resistance Monitoring Method.
Li X, Gao L, Ni T, Zhou J, Li X, Li Y, Xu L, Wang R, Zeng C, Li B, Luo J, Li J.
Li X, et al. Among authors: gao l.
Micromachines (Basel). 2023 Mar 12;14(3):640. doi: 10.3390/mi14030640.
Micromachines (Basel). 2023.
PMID: 36985047
Free PMC article.
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