Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 ∘ variety. As reference compound for this investigation we use Cr 2 O 3 . Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 ∘ domain states of Cr 2 O 3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.
Keywords: Cr2O3; antiferromagnetic domains; magnetoelectric force microscopy; second harmonic generation.