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Cathodoluminescence Spectroscopic Stress Analysis for Silicon Oxide Film and Its Damage Evaluation.
Materials (Basel). 2020 Oct 10;13(20):4490. doi: 10.3390/ma13204490.
Materials (Basel). 2020.
PMID: 33050445
Free PMC article.
SERRS fiber probe: fabrication of silver nanoparticles at the aperture of an optical fiber used for SNOM.
Kitahama Y, Itoh T, Aoyama J, Nishikata K, Ozaki Y.
Kitahama Y, et al. Among authors: nishikata k.
Chem Commun (Camb). 2009 Nov 21;(43):6563-5. doi: 10.1039/b909603e. Epub 2009 Sep 14.
Chem Commun (Camb). 2009.
PMID: 19865650
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In-situ cathodoluminescence spectroscopy of silicon oxide thin film under uniaxial tensile loading.
Namazu T, Yamashita N, Kakinuma S, Nishikata K, Naka N, Matsumoto K, Inoue S.
Namazu T, et al. Among authors: nishikata k.
J Nanosci Nanotechnol. 2011 Apr;11(4):2861-6. doi: 10.1166/jnn.2011.3902.
J Nanosci Nanotechnol. 2011.
PMID: 21776644
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