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Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework.
Ultramicroscopy. 2018 Apr;187:144-163. doi: 10.1016/j.ultramic.2018.01.002. Epub 2018 Feb 3.
Ultramicroscopy. 2018.
PMID: 29499524
Free article.
Ultra-Stretchable Interconnects for High-Density Stretchable Electronics.
Shafqat S, Hoefnagels JPM, Savov A, Joshi S, Dekker R, Geers MGD.
Shafqat S, et al. Among authors: hoefnagels jpm.
Micromachines (Basel). 2017 Sep 13;8(9):277. doi: 10.3390/mi8090277.
Micromachines (Basel). 2017.
PMID: 30400467
Free PMC article.
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Absolute surface coverage measurement using a vibrational overtone.
Pipino AC, Hoefnagels JP, Watanabe N.
Pipino AC, et al. Among authors: hoefnagels jp.
J Chem Phys. 2004 Feb 8;120(6):2879-88. doi: 10.1063/1.1637338.
J Chem Phys. 2004.
PMID: 15268435
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