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Spectral interferometry and reflectometry used for characterization of a multilayer mirror.
Opt Lett. 2009 May 15;34(10):1564-6. doi: 10.1364/ol.34.001564.
Opt Lett. 2009.
PMID: 19448822
Free article.
Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement.
Lunácek J, Hlubina P, Lunácková M.
Lunácek J, et al.
Appl Opt. 2009 Feb 10;48(5):985-9. doi: 10.1364/ao.48.000985.
Appl Opt. 2009.
PMID: 19209215
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Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure.
Hlubina P, Ciprian D, Lunacek J.
Hlubina P, et al. Among authors: lunacek j.
Opt Lett. 2009 Sep 1;34(17):2661-3. doi: 10.1364/OL.34.002661.
Opt Lett. 2009.
PMID: 19724524
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