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Page 1
Advanced GeSn/SiGeSn Group IV Heterostructure Lasers.
Adv Sci (Weinh). 2018 Mar 27;5(6):1700955. doi: 10.1002/advs.201700955. eCollection 2018 Jun.
Adv Sci (Weinh). 2018.
PMID: 29938172
Free PMC article.
SiGeSn Ternaries for Efficient Group IV Heterostructure Light Emitters.
von den Driesch N, Stange D, Wirths S, Rainko D, Povstugar I, Savenko A, Breuer U, Geiger R, Sigg H, Ikonic Z, Hartmann JM, Grützmacher D, Mantl S, Buca D.
von den Driesch N, et al. Among authors: povstugar i.
Small. 2017 Apr;13(16). doi: 10.1002/smll.201603321. Epub 2017 Feb 3.
Small. 2017.
PMID: 28160408
Free article.
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Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale.
Povstugar I, Weber J, Naumenko D, Huang T, Klinkenberg M, Quadakkers WJ.
Povstugar I, et al.
Microsc Microanal. 2019 Feb;25(1):11-20. doi: 10.1017/S143192761801557X. Epub 2019 Feb 4.
Microsc Microanal. 2019.
PMID: 30712525
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Growth and Electrical Characterization of Hybrid Core/Shell InAs/CdSe Nanowires.
Kaladzhian M, von den Driesch N, Demarina N, Povstugar I, Zimmermann E, Jansen MM, Bae JH, Krause C, Bennemann B, Grützmacher D, Schäpers T, Pawlis A.
Kaladzhian M, et al. Among authors: povstugar i.
ACS Appl Mater Interfaces. 2024 Feb 28;16(8):11035-11042. doi: 10.1021/acsami.3c18267. Epub 2024 Feb 20.
ACS Appl Mater Interfaces. 2024.
PMID: 38377460
Free PMC article.
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Thermal stability of TiAlN/CrN multilayer coatings studied by atom probe tomography.
Choi PP, Povstugar I, Ahn JP, Kostka A, Raabe D.
Choi PP, et al. Among authors: povstugar i.
Ultramicroscopy. 2011 May;111(6):518-23. doi: 10.1016/j.ultramic.2010.11.012. Epub 2010 Nov 19.
Ultramicroscopy. 2011.
PMID: 21146308
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Crystallization of amorphous Fe90Zr10 under ball milling.
Kwon YS, Kim JS, Kim JC, Kwon YJ, Povstugar I, Yelsukov E, Kim CE, Lee HS.
Kwon YS, et al. Among authors: povstugar i.
J Nanosci Nanotechnol. 2010 Jan;10(1):336-9. doi: 10.1166/jnn.2010.1527.
J Nanosci Nanotechnol. 2010.
PMID: 20352857
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