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Year | Number of Results |
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2022 | 5 |
2023 | 1 |
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jin ho seong
(8 results)?
Investigation into SiO2 Etching Characteristics Using Fluorocarbon Capacitively Coupled Plasmas: Etching with Radical/Ion Flux-Controlled.
Nanomaterials (Basel). 2022 Dec 15;12(24):4457. doi: 10.3390/nano12244457.
Nanomaterials (Basel). 2022.
PMID: 36558310
Free PMC article.
Observation of prior light emission before arcing development in a low-temperature plasma with multiple snapshot analysis.
Kim SJ, Lee YS, Cho CH, Choi MS, Seong IH, Lee JJ, Kim DW, You SJ.
Kim SJ, et al. Among authors: seong ih.
Sci Rep. 2022 Dec 5;12(1):20976. doi: 10.1038/s41598-022-25550-2.
Sci Rep. 2022.
PMID: 36470956
Free PMC article.
Item in Clipboard
Influence of Additive N2 on O2 Plasma Ashing Process in Inductively Coupled Plasma.
You YB, Lee YS, Kim SJ, Cho CH, Seong IH, Jeong WN, Choi MS, You SJ.
You YB, et al. Among authors: seong ih.
Nanomaterials (Basel). 2022 Oct 27;12(21):3798. doi: 10.3390/nano12213798.
Nanomaterials (Basel). 2022.
PMID: 36364574
Free PMC article.
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Development of a High-Linearity Voltage and Current Probe with a Floating Toroidal Coil: Principle, Demonstration, Design Optimization, and Evaluation.
Kim SJ, Seong IH, Lee YS, Cho CH, Jeong WN, You YB, Lee JJ, You SJ.
Kim SJ, et al. Among authors: seong ih.
Sensors (Basel). 2022 Aug 5;22(15):5871. doi: 10.3390/s22155871.
Sensors (Basel). 2022.
PMID: 35957427
Free PMC article.
Item in Clipboard
Development of the Tele-Measurement of Plasma Uniformity via Surface Wave Information (TUSI) Probe for Non-Invasive In-Situ Monitoring of Electron Density Uniformity in Plasma Display Fabrication Process.
Kim SJ, Choi MS, Lee SH, Jeong WN, Lee YS, Seong IH, Cho CH, Kim DW, You SJ.
Kim SJ, et al. Among authors: seong ih.
Sensors (Basel). 2023 Feb 24;23(5):2521. doi: 10.3390/s23052521.
Sensors (Basel). 2023.
PMID: 36904724
Free PMC article.
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Development of the Measurement of Lateral Electron Density (MOLE) Probe Applicable to Low-Pressure Plasma Diagnostics.
Kim SJ, Lee SH, You YB, Lee YS, Seong IH, Cho CH, Lee JJ, You SJ.
Kim SJ, et al. Among authors: seong ih.
Sensors (Basel). 2022 Jul 22;22(15):5487. doi: 10.3390/s22155487.
Sensors (Basel). 2022.
PMID: 35897990
Free PMC article.
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