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Page 1
Surface and thickness measurement of a transparent film using wavelength scanning interferometry.
Opt Express. 2012 Sep 10;20(19):21450-6. doi: 10.1364/OE.20.021450.
Opt Express. 2012.
PMID: 23037266
Free article.
Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization.
Zhang T, Gao F, Muhamedsalih H, Lou S, Martin H, Jiang X.
Zhang T, et al. Among authors: muhamedsalih h.
Appl Opt. 2018 Mar 20;57(9):2227-2234. doi: 10.1364/AO.57.002227.
Appl Opt. 2018.
PMID: 29604017
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Comparison study of algorithms and accuracy in the wavelength scanning interferometry.
Muhamedsalih H, Gao F, Jiang X.
Muhamedsalih H, et al.
Appl Opt. 2012 Dec 20;51(36):8854-62. doi: 10.1364/AO.51.008854.
Appl Opt. 2012.
PMID: 23262625
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Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise.
Jiang X, Wang K, Gao F, Muhamedsalih H.
Jiang X, et al. Among authors: muhamedsalih h.
Appl Opt. 2010 May 20;49(15):2903-9. doi: 10.1364/AO.49.002903.
Appl Opt. 2010.
PMID: 20490253
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