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fu wen qin
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Reliability and Stability Improvement of MOS Capacitors via Nitrogen-Hydrogen Mixed Plasma Pretreatment for SiC Surfaces.
ACS Appl Mater Interfaces. 2023 Apr 12;15(14):18537-18549. doi: 10.1021/acsami.3c00995. Epub 2023 Mar 28.
ACS Appl Mater Interfaces. 2023.
PMID: 36987379
Effect of Y-doping on switching mechanisms and impedance spectroscopy of HfOx-based RRAM devices.
Bai J, Xie W, Qu D, Wei S, Li Y, Qin F, Ji M, Wang D.
Bai J, et al. Among authors: qin f.
Nanotechnology. 2023 Mar 20;34(23). doi: 10.1088/1361-6528/acc078.
Nanotechnology. 2023.
PMID: 36863007
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