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Thorough Wide-Temperature-Range Analysis of Pt/SiC and Cr/SiC Schottky Contact Non-Uniformity.
Materials (Basel). 2024 Jan 13;17(2):400. doi: 10.3390/ma17020400.
Materials (Basel). 2024.
PMID: 38255568
Free PMC article.
400 °C Sensor Based on Ni/4H-SiC Schottky Diode for Reliable Temperature Monitoring in Industrial Environments.
Draghici F, Brezeanu G, Pristavu G, Pascu R, Badila M, Pribeanu A, Ceuca E.
Draghici F, et al. Among authors: ceuca e.
Sensors (Basel). 2019 May 24;19(10):2384. doi: 10.3390/s19102384.
Sensors (Basel). 2019.
PMID: 31137664
Free PMC article.
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