Comparison of different methodologies for estimating gold thickness in multilayer samples using XRF spectra

Elvira Scialla; Jessica Brocchieri; Carlo Sabbarese

doi:10.1016/j.apradiso.2022.110517

Comparison of different methodologies for estimating gold thickness in multilayer samples using XRF spectra

Appl Radiat Isot. 2023 Jan:191:110517. doi: 10.1016/j.apradiso.2022.110517. Epub 2022 Oct 19.

Authors

Elvira Scialla¹, Jessica Brocchieri¹, Carlo Sabbarese²

Affiliations

¹ Department of Mathematics and Physics, University of Campania 'Luigi Vanvitelli' and CIRCE, Center for Isotopic Research on the Cultural and Environmental Heritage, Viale Lincoln 5, Caserta, Italy.
² Department of Mathematics and Physics, University of Campania 'Luigi Vanvitelli' and CIRCE, Center for Isotopic Research on the Cultural and Environmental Heritage, Viale Lincoln 5, Caserta, Italy. Electronic address: carlo.sabbarese@unicampania.it.

PMID: 36327609
DOI: 10.1016/j.apradiso.2022.110517

Abstract

A detailed comparison of methodologies for assessing gold leaf thickness in multilayer samples using the XRF technique was performed. Standard three-layer samples and six methods of analysis were used: two-line ratio of one or two elements, de Boer's analytical procedure, multivariate PLS analysis and percentage concentration of elements in the layers. The accuracy of each method and the consistency among the results of the methods emerged. The PLS method and the analytical approach might be preferred because they are faster.

Keywords: Au, Ag and Pb standard Sample; PLS method; Thickness determination of Au; XRF analysis Methods; de Boer's analytical procedure.

MeSH terms

Gold*

Substances

Gold