X-ray Diffuse Scattering from Ca₃NbGa₃Si₂O₁₄ Single Crystal under External Electric Field Application

X-ray diffuse scattering from the Ca₃NbGa₃Si₂O₁₄ (CNGS) crystal was measured with a triple axis X-ray diffractometer under the conditions of an external electric field. It is found that the nature of the intensity distribution of the asymmetrical part of diffuse scattering depends on the value of the applied electric field. This phenomenon is apparently associated with different piezoelectric characteristics of defect regions and the rest of the single crystal.