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Page 1
In Situ and Real-Time Nanoscale Monitoring of Ultra-Thin Metal Film Growth Using Optical and Electrical Diagnostic Tools.
Nanomaterials (Basel). 2020 Nov 9;10(11):2225. doi: 10.3390/nano10112225.
Nanomaterials (Basel). 2020.
PMID: 33182409
Free PMC article.
Review.
Interfacial Silicide Formation and Stress Evolution during Sputter Deposition of Ultrathin Pd Layers on a-Si.
Krause B, Abadias G, Furgeaud C, Michel A, Resta A, Coati A, Garreau Y, Vlad A, Hauschild D, Baumbach T.
Krause B, et al. Among authors: furgeaud c.
ACS Appl Mater Interfaces. 2019 Oct 23;11(42):39315-39323. doi: 10.1021/acsami.9b11492. Epub 2019 Oct 8.
ACS Appl Mater Interfaces. 2019.
PMID: 31547648
Free article.
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Epitaxial growth of Cu(001) thin films onto Si(001) using a single-step HiPIMS process.
Cemin F, Lundin D, Furgeaud C, Michel A, Amiard G, Minea T, Abadias G.
Cemin F, et al. Among authors: furgeaud c.
Sci Rep. 2017 May 10;7(1):1655. doi: 10.1038/s41598-017-01755-8.
Sci Rep. 2017.
PMID: 28490804
Free PMC article.
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