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Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Adv Mater. 2022 Dec;34(48):e2201082. doi: 10.1002/adma.202201082. Epub 2022 Apr 10.
Adv Mater. 2022.
PMID: 35318749
Review.
Observation of Rich Defect Dynamics in Monolayer MoS2.
Ravichandran H, Knobloch T, Pannone A, Karl A, Stampfer B, Waldhoer D, Zheng Y, Sakib NU, Karim Sadaf MU, Pendurthi R, Torsi R, Robinson JA, Grasser T, Das S.
Ravichandran H, et al. Among authors: stampfer b.
ACS Nano. 2023 Aug 8;17(15):14449-14460. doi: 10.1021/acsnano.2c12900. Epub 2023 Jul 25.
ACS Nano. 2023.
PMID: 37490390
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Characterization of Single Defects in Ultrascaled MoS2 Field-Effect Transistors.
Stampfer B, Zhang F, Illarionov YY, Knobloch T, Wu P, Waltl M, Grill A, Appenzeller J, Grasser T.
Stampfer B, et al.
ACS Nano. 2018 Jun 26;12(6):5368-5375. doi: 10.1021/acsnano.8b00268. Epub 2018 Jun 12.
ACS Nano. 2018.
PMID: 29878746
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Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors.
Stampfer B, Schanovsky F, Grasser T, Waltl M.
Stampfer B, et al.
Micromachines (Basel). 2020 Apr 23;11(4):446. doi: 10.3390/mi11040446.
Micromachines (Basel). 2020.
PMID: 32340395
Free PMC article.
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