Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2023 | 1 |
2024 | 2 |
Search Results
3 results
Results by year
Filters applied: . Clear all
It looks like you are searching for an author.
Results are currently sorted by Best Match. To see the newest results first,
change the sort order to Most Recent.
Page 1
Four-Point Measurement Setup for Correlative Microscopy of Nanowires.
Nanomaterials (Basel). 2023 Aug 30;13(17):2451. doi: 10.3390/nano13172451.
Nanomaterials (Basel). 2023.
PMID: 37686959
Free PMC article.
Wavelet-based information theory in quantitative assessment of AFM images' quality.
Pruchnik BC, Putek PA, Gotszalk TP.
Pruchnik BC, et al.
Sci Rep. 2024 Feb 18;14(1):3996. doi: 10.1038/s41598-024-53846-y.
Sci Rep. 2024.
PMID: 38369551
Free PMC article.
Item in Clipboard
Atomic force microscopy in mechanical measurements of single nanowires.
Pruchnik BC, Fidelus JD, Gacka E, Mika K, Zaraska L, Sulka GD, Gotszalk TP.
Pruchnik BC, et al.
Ultramicroscopy. 2024 May 7;263:113985. doi: 10.1016/j.ultramic.2024.113985. Online ahead of print.
Ultramicroscopy. 2024.
PMID: 38759603
Item in Clipboard
Cite
Cite