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Year | Number of Results |
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2004 | 1 |
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Page 1
Interferometric metrology probe for highly sloped freeform optics.
Appl Opt. 2023 Nov 10;62(32):8482-8490. doi: 10.1364/AO.500553.
Appl Opt. 2023.
PMID: 38037960
Spectrally controlled interferometry.
Salsbury C, Olszak AG.
Salsbury C, et al. Among authors: olszak ag.
Appl Opt. 2017 Oct 1;56(28):7781-7788. doi: 10.1364/AO.56.007781.
Appl Opt. 2017.
PMID: 29047761
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A Feedback Control Sensing System of an Electrorheological Brake to Exert a Constant Pressing Force on an Object.
Spotowski T, Osowski K, Musiałek I, Olszak A, Kęsy A, Kęsy Z, Choi S.
Spotowski T, et al. Among authors: olszak a.
Sensors (Basel). 2023 Aug 7;23(15):6996. doi: 10.3390/s23156996.
Sensors (Basel). 2023.
PMID: 37571783
Free PMC article.
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An array microscope for ultrarapid virtual slide processing and telepathology. Design, fabrication, and validation study.
Weinstein RS, Descour MR, Liang C, Barker G, Scott KM, Richter L, Krupinski EA, Bhattacharyya AK, Davis JR, Graham AR, Rennels M, Russum WC, Goodall JF, Zhou P, Olszak AG, Williams BH, Wyant JC, Bartels PH.
Weinstein RS, et al. Among authors: olszak ag.
Hum Pathol. 2004 Nov;35(11):1303-14. doi: 10.1016/j.humpath.2004.09.002.
Hum Pathol. 2004.
PMID: 15668886
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High-precision shape measurement by white-light interferometry with real-time scanner error correction.
Schmit J, Olszak A.
Schmit J, et al. Among authors: olszak a.
Appl Opt. 2002 Oct 1;41(28):5943-50. doi: 10.1364/ao.41.005943.
Appl Opt. 2002.
PMID: 12371554
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