Test Rig for Investigating the Functional and Structural Fatigue of Shape Memory Alloy Wires Based on Different Activation Profiles

This work presents a test rig developed for testing the lifetime of electrically and cyclically activated shape memory alloy wires. This test rig is developed to provide information on the functional and structural fatigue of the wires. Therefore, electrical activation on the test rig can be carried out using different activation profiles, because it is of great research interest to determine whether those profiles have a significant influence on the wire's lifetime and functional behavior. The test rig monitors the process parameters such as stroke, current, voltage, and force. After presenting the electrical and mechanical design of the test rig, this publication evaluates an initial series of tests to demonstrate its functionality. Three different activation profiles are run in parallel on four identical test rig setups and are then evaluated. The functionality of the test rig is verified by a detailed evaluation of the process data on the one hand, and by comparing the results with existing literature on the other. The functionality of the test rig can thus be verified. At the same time, the strong influence of the different activation profiles on both the lifetime and the functional properties of the shape memory alloy wires becomes clear.