Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Mohamed Abdel-Rahman; Esam Bahidra; Ahmed Fauzi Abas

doi:10.3390/ma13082002

Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Materials (Basel). 2020 Apr 24;13(8):2002. doi: 10.3390/ma13082002.

Authors

Mohamed Abdel-Rahman^{1

2}, Esam Bahidra^{1

2}, Ahmed Fauzi Abas¹

Affiliations

¹ Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.
² KACST-TIC in Radio Frequency and Photonics for the e-Society (RFTONICS), College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.

Abstract

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (dn/dTs) were observed. The highest dn/dTs, measured at approximately 40 °C, were -8.4 × 10^-3/°C and -1.05 × 10^-2/°C at 1550 nm and 2000 nm, respectively.

Keywords: infrared ellipsometry; optical constants; thermo-optic coefficient; thin film; vanadium sesquioxide.