SiO2/Si interface properties using positrons.
Asoka-Kumar P, Lynn KG, Leung TC, Nielsen B, Rubloff GW, Weinberg ZA.
Asoka-Kumar P, et al. Among authors: lynn kg.
Phys Rev B Condens Matter. 1991 Sep 15;44(11):5885-5888. doi: 10.1103/physrevb.44.5885.
Phys Rev B Condens Matter. 1991.
PMID: 9998435
No abstract available.