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In situ TEM observation of rebonding on fractured silicon carbide.
Zhang Z , Cui J , Wang B , Jiang H , Chen G , Yu J , Lin C , Tang C , Hartmaier A , Zhang J , Luo J , Rosenkranz A , Jiang N , Guo D . Zhang Z , et al. Among authors: zhang j. Nanoscale. 2018 Apr 5;10(14):6261-6269. doi: 10.1039/c8nr00341f. Nanoscale. 2018. PMID: 29461562
Deformation induced new pathways in silicon.
Zhang Z, Cui J, Chang K, Liu D, Chen G, Jiang N, Guo D. Zhang Z, et al. Nanoscale. 2019 May 28;11(20):9862-9868. doi: 10.1039/c9nr01478k. Epub 2019 Mar 27. Nanoscale. 2019. PMID: 30916053
Unprecedented Piezoresistance Coefficient in Strained Silicon Carbide.
Cui J, Zhang Z, Liu D, Zhang D, Hu W, Zou L, Lu Y, Zhang C, Lu H, Tang C, Jiang N, Parkin IP, Guo D. Cui J, et al. Among authors: zhang c, zhang d, zhang z. Nano Lett. 2019 Sep 11;19(9):6569-6576. doi: 10.1021/acs.nanolett.9b02821. Epub 2019 Aug 7. Nano Lett. 2019. PMID: 31381357
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