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Climatically Accelerated Material Processes Determining the Long-Term Reliability of Light-Emitting Diodes.
Materials (Basel). 2024 Apr 3;17(7):1643. doi: 10.3390/ma17071643.
Materials (Basel). 2024.
PMID: 38612158
Free PMC article.
Built-In Self-Test (BIST) Methods for MEMS: A Review.
Hantos G, Flynn D, Desmulliez MPY.
Hantos G, et al.
Micromachines (Basel). 2020 Dec 31;12(1):40. doi: 10.3390/mi12010040.
Micromachines (Basel). 2020.
PMID: 33396351
Free PMC article.
Review.
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