X-ray STM: Nanoscale elemental analysis & Observation of atomic track.
Saito A, Furudate Y, Kusui Y, Saito T, Akai-Kasaya M, Tanaka Y, Tamasaku K, Kohmura Y, Ishikawa T, Kuwahara Y, Aono M.
Saito A, et al. Among authors: kusui y.
Microscopy (Oxf). 2014 Nov;63 Suppl 1:i14-i15. doi: 10.1093/jmicro/dfu045.
Microscopy (Oxf). 2014.
PMID: 25359805