Charge Trapping and Defect Dynamics as Origin of Memory Effects in Metal Halide Perovskite Memlumors.
Marunchenko A, Kumar J, Kiligaridis A, Rao SM, Tatarinov D, Matchenya I, Sapozhnikova E, Ji R, Telschow O, Brunner J, Yulin A, Pushkarev A, Vaynzof Y, Scheblykin IG.
Marunchenko A, et al. Among authors: rao sm.
J Phys Chem Lett. 2024 Jun 6:6256-6265. doi: 10.1021/acs.jpclett.4c00985. Online ahead of print.
J Phys Chem Lett. 2024.
PMID: 38843474