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Design and Development of a Diagnostic System for a Non-Intercepting Direct Measure of the SPIDER Ion Source Beamlet Current.
Patton T, Shepherd A, Pouradier Duteil B, Rigoni Garola A, Brombin M, Candeloro V, Manduchi G, Pavei M, Pasqualotto R, Pimazzoni A, Siragusa M, Serianni G, Sartori E, Taliercio C, Barbato P, Cervaro V, Ghiraldelli R, Laterza B, Rossetto F. Patton T, et al. Among authors: pimazzoni a. Sensors (Basel). 2023 Jul 7;23(13):6211. doi: 10.3390/s23136211. Sensors (Basel). 2023. PMID: 37448058 Free PMC article.
Spatially resolved diagnostics for optimization of large ion beam sources.
Serianni G, Sartori E, Agnello R, Agostinetti P, Agostini M, Barbisan M, Brombin M, Candeloro V, Dalla Palma M, Delogu R, De Muri M, Fadone M, Mario I, Patton T, Pimazzoni A, Poggi C, Pouradier-Duteil B, Segalini B, Shepherd A, Spolaore M, Taliercio C, Ugoletti M, Veltri P, Zaniol B, Pasqualotto R. Serianni G, et al. Among authors: pimazzoni a. Rev Sci Instrum. 2022 Aug 1;93(8):081101. doi: 10.1063/5.0084797. Rev Sci Instrum. 2022. PMID: 36050050
First operation in SPIDER and the path to complete MITICA.
Serianni G, Toigo V, Bigi M, Boldrin M, Chitarin G, Dal Bello S, Grando L, Luchetta A, Marcuzzi D, Pasqualotto R, Pomaro N, Zaccaria P, Zanotto L, Agostinetti P, Agostini M, Antoni V, Aprile D, Barbisan M, Battistella M, Brombin M, Canton A, Cavazzana R, Dalla Palma M, Dan M, Delogu R, De Lorenzi A, De Muri M, Denizeau S, Fadone M, Fellin F, Ferro A, Gaio E, Gambetta G, Gasparini F, Gnesotto F, Jain P, Maistrello A, Manduchi G, Manfrin S, Marchiori G, Marconato N, Moresco M, Patton T, Pavei M, Peruzzo S, Pilan N, Pimazzoni A, Piovan R, Poggi C, Recchia M, Rigoni A, Rizzolo A, Rostagni G, Sartori E, Siragusa M, Sonato P, Spada E, Spagnolo S, Spolaore M, Taliercio C, Tinti P, Ugoletti M, Valente M, Zamengo A, Zaniol B, Zaupa M, Cavenago M, Boilson D, Rotti C, Veltri P, Chareyre J, Decamps H, Dremel M, Graceffa J, Geli F, Schunke B, Svensson L, Urbani M, Bonicelli T, Agarici G, Garbuglia A, Masiello A, Paolucci F, Simon M, Bailly-Maitre L, Bragulat E, Gomez G, Gutierrez D, Labate C, Mico G, Moreno JF, Pilard V, Kouzmenko G, Rousseau A, Chakraborty A, Baruah U, Patel H, Singh NP, Patel A, Dhola H, Raval B, Cristofaro S, Fantz U, Heinemann B, Kraus W, Kashiwagi M, Tobari H. Serianni G, et al. Among authors: pimazzoni a. Rev Sci Instrum. 2020 Feb 1;91(2):023510. doi: 10.1063/1.5133076. Rev Sci Instrum. 2020. PMID: 32113382
Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility.
Wimmer C, Bonomo F, Hurlbatt A, Schiesko L, Fantz U, Harder ND, Heinemann B, Mimo A, Orozco G, Agostini M, Barbisan M, Brombin M, Delogu R, Pimazzoni A, Poggi C, Serianni G, Ugoletti M, Veltri P. Wimmer C, et al. Among authors: pimazzoni a. Rev Sci Instrum. 2020 Jan 1;91(1):013509. doi: 10.1063/1.5129336. Rev Sci Instrum. 2020. PMID: 32012577
Beam and installation improvements of the NIO1 ion source.
Cavenago M, Barbisan M, Delogu R, Pimazzoni A, Poggi C, Ugoletti M, Agostini M, Antoni V, Baltador C, Cervaro V, De Muri M, Giora D, Jain P, Laterza B, Maero G, Maniero M, Martini D, Minarello A, Ravarotto D, Recchia D, Rizzolo A, Romé M, Sartori E, Sattin M, Serianni G, Taccogna F, Valentino V, Variale V, Veltri P. Cavenago M, et al. Among authors: pimazzoni a. Rev Sci Instrum. 2020 Jan 1;91(1):013316. doi: 10.1063/1.5128658. Rev Sci Instrum. 2020. PMID: 32012575 Free article.