Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response.
Geandier G, Thiaudière D, Randriamazaoro RN, Chiron R, Djaziri S, Lamongie B, Diot Y, Le Bourhis E, Renault PO, Goudeau P, Bouaffad A, Castelnau O, Faurie D, Hild F.
Geandier G, et al. Among authors: hild f.
Rev Sci Instrum. 2010 Oct;81(10):103903. doi: 10.1063/1.3488628.
Rev Sci Instrum. 2010.
PMID: 21034098