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Shaping single crystalline BaTiO3nanostructures by focused neon or helium ion milling.
Nanotechnology. 2024 May 28;35(33). doi: 10.1088/1361-6528/ad4713.
Nanotechnology. 2024.
PMID: 38701774
New probes based on carbon nano-cones for scanning probe microscopies.
Cours R, Paredes G, Masseboeuf A, Ondarçuhu T, Seine G, Puech P, Arenal R, Piazza F, Monthioux M.
Cours R, et al.
Ultramicroscopy. 2023 Mar;245:113667. doi: 10.1016/j.ultramic.2022.113667. Epub 2022 Dec 18.
Ultramicroscopy. 2023.
PMID: 36563496
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Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by Operando Electron Holography.
Gatel C, Serra R, Gruel K, Masseboeuf A, Chapuis L, Cours R, Zhang L, Warot-Fonrose B, Hÿtch MJ.
Gatel C, et al. Among authors: cours r.
Phys Rev Lett. 2022 Sep 23;129(13):137701. doi: 10.1103/PhysRevLett.129.137701.
Phys Rev Lett. 2022.
PMID: 36206432
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Synthesis of hybrid colloidal nanoparticles for a generic approach to 3D electrostatic directed assembly: Application to anti-counterfeiting.
Platel R, Vaure L, Palleau E, Raffy S, Guérin F, Lagarde D, Cours R, Marcelot C, Warot-Fonrose B, Nayral C, Delpech F, Ressier L.
Platel R, et al. Among authors: cours r.
J Colloid Interface Sci. 2021 Jan 15;582(Pt B):1243-1250. doi: 10.1016/j.jcis.2020.08.098. Epub 2020 Aug 29.
J Colloid Interface Sci. 2021.
PMID: 32950840
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200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy.
Mamishin S, Kubo Y, Cours R, Monthioux M, Houdellier F.
Mamishin S, et al. Among authors: cours r.
Ultramicroscopy. 2017 Nov;182:303-307. doi: 10.1016/j.ultramic.2017.07.018. Epub 2017 Aug 9.
Ultramicroscopy. 2017.
PMID: 28806543
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Inhomogeneous spatial distribution of the magnetic transition in an iron-rhodium thin film.
Gatel C, Warot-Fonrose B, Biziere N, Rodríguez LA, Reyes D, Cours R, Castiella M, Casanove MJ.
Gatel C, et al. Among authors: cours r.
Nat Commun. 2017 Jun 7;8:15703. doi: 10.1038/ncomms15703.
Nat Commun. 2017.
PMID: 28589931
Free PMC article.
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Dynamical effects in strain measurements by dark-field electron holography.
Javon E, Lubk A, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hÿtch MJ.
Javon E, et al. Among authors: cours r.
Ultramicroscopy. 2014 Dec;147:70-85. doi: 10.1016/j.ultramic.2014.06.005. Epub 2014 Jun 30.
Ultramicroscopy. 2014.
PMID: 25062040
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