Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives.
Losurdo M, Bergmair M, Bruno G, Cattelan D, Cobet C, de Martino A, Fleischer K, Dohcevic-Mitrovic Z, Esser N, Galliet M, Gajic R, Hemzal D, Hingerl K, Humlicek J, Ossikovski R, Popovic ZV, Saxl O.
Losurdo M, et al. Among authors: ossikovski r.
J Nanopart Res. 2009 Oct;11(7):1521-1554. doi: 10.1007/s11051-009-9662-6. Epub 2009 Jun 12.
J Nanopart Res. 2009.
PMID: 21170135
Free PMC article.