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A Correlative Study of Interfacial Segregation in a Cu-Doped TiNiSn Thermoelectric half-Heusler Alloy.
ACS Appl Electron Mater. 2022 Sep 27;4(9):4446-4454. doi: 10.1021/acsaelm.2c00699. Epub 2022 Aug 23.
ACS Appl Electron Mater. 2022.
PMID: 36185076
Free PMC article.
An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam.
Halpin JE, Webster RWH, Gardner H, Moody MP, Bagot PAJ, MacLaren DA.
Halpin JE, et al. Among authors: webster rwh.
Ultramicroscopy. 2019 Jul;202:121-127. doi: 10.1016/j.ultramic.2019.04.005. Epub 2019 Apr 12.
Ultramicroscopy. 2019.
PMID: 31005819
Free article.
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization.
Paterson GW, Webster RWH, Ross A, Paton KA, Macgregor TA, McGrouther D, MacLaren I, Nord M.
Paterson GW, et al. Among authors: webster rwh.
Microsc Microanal. 2020 Oct;26(5):944-963. doi: 10.1017/S1431927620024307.
Microsc Microanal. 2020.
PMID: 32883393
Free article.
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage.
Nord M, Webster RWH, Paton KA, McVitie S, McGrouther D, MacLaren I, Paterson GW.
Nord M, et al. Among authors: webster rwh.
Microsc Microanal. 2020 Aug;26(4):653-666. doi: 10.1017/S1431927620001713.
Microsc Microanal. 2020.
PMID: 32627727
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Correction of EELS dispersion non-uniformities for improved chemical shift analysis.
Webster R, Craven AJ, Schaffer B, McFadzean S, MacLaren I, MacLaren DA.
Webster R, et al.
Ultramicroscopy. 2020 Oct;217:113069. doi: 10.1016/j.ultramic.2020.113069. Epub 2020 Jul 2.
Ultramicroscopy. 2020.
PMID: 32659452
Free article.
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