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Highly enhanced ferroelectricity in HfO2-based ferroelectric thin film by light ion bombardment.
Kang S, Jang WS, Morozovska AN, Kwon O, Jin Y, Kim YH, Bae H, Wang C, Yang SH, Belianinov A, Randolph S, Eliseev EA, Collins L, Park Y, Jo S, Jung MH, Go KJ, Cho HW, Choi SY, Jang JH, Kim S, Jeong HY, Lee J, Ovchinnikova OS, Heo J, Kalinin SV, Kim YM, Kim Y. Kang S, et al. Among authors: heo j. Science. 2022 May 13;376(6594):731-738. doi: 10.1126/science.abk3195. Epub 2022 May 12. Science. 2022. PMID: 35549417
Ultrathin ferroic HfO2-ZrO2 superlattice gate stack for advanced transistors.
Cheema SS, Shanker N, Wang LC, Hsu CH, Hsu SL, Liao YH, San Jose M, Gomez J, Chakraborty W, Li W, Bae JH, Volkman SK, Kwon D, Rho Y, Pinelli G, Rastogi R, Pipitone D, Stull C, Cook M, Tyrrell B, Stoica VA, Zhang Z, Freeland JW, Tassone CJ, Mehta A, Saheli G, Thompson D, Suh DI, Koo WT, Nam KJ, Jung DJ, Song WB, Lin CH, Nam S, Heo J, Parihar N, Grigoropoulos CP, Shafer P, Fay P, Ramesh R, Mahapatra S, Ciston J, Datta S, Mohamed M, Hu C, Salahuddin S. Cheema SS, et al. Among authors: heo j. Nature. 2022 Apr;604(7904):65-71. doi: 10.1038/s41586-022-04425-6. Epub 2022 Apr 6. Nature. 2022. PMID: 35388197
Graphene for true Ohmic contact at metal-semiconductor junctions.
Byun KE, Chung HJ, Lee J, Yang H, Song HJ, Heo J, Seo DH, Park S, Hwang SW, Yoo I, Kim K. Byun KE, et al. Among authors: heo j. Nano Lett. 2013 Sep 11;13(9):4001-5. doi: 10.1021/nl402367y. Epub 2013 Aug 30. Nano Lett. 2013. PMID: 23978262
3,502 results