Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Search Results
2 results
Filters applied: . Clear all
Results are displayed in a computed author sort order.
The Results By Year timeline is not available.
Page 1
Deep Q-Learning with Bit-Swapping-Based Linear Feedback Shift Register fostered Built-In Self-Test and Built-In Self-Repair for SRAM.
Micromachines (Basel). 2022 Jun 19;13(6):971. doi: 10.3390/mi13060971.
Micromachines (Basel). 2022.
PMID: 35744586
Free PMC article.
Optimal Method for Test and Repair Memories Using Redundancy Mechanism for SoC.
Alnatheer S, Ahmed MA.
Alnatheer S, et al.
Micromachines (Basel). 2021 Jul 10;12(7):811. doi: 10.3390/mi12070811.
Micromachines (Basel). 2021.
PMID: 34357221
Free PMC article.
Item in Clipboard
Cite
Cite