Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors.
Zhang Q, Hu G, de Boo GG, Rančić M, Johnson BC, McCallum JC, Du J, Sellars MJ, Yin C, Rogge S.
Zhang Q, et al. Among authors: hu g.
Nano Lett. 2019 Aug 14;19(8):5025-5030. doi: 10.1021/acs.nanolett.9b01281. Epub 2019 Jul 3.
Nano Lett. 2019.
PMID: 31251075