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The Hydrogenation Impact on Electronic Properties of p-Diamond/n-Si Heterojunctions.
Materials (Basel). 2021 Nov 3;14(21):6615. doi: 10.3390/ma14216615.
Materials (Basel). 2021.
PMID: 34772142
Free PMC article.
The n-Si/p-CVD Diamond Heterojunction.
Łoś S, Paprocki K, Szybowicz M, Fabisiak K.
Łoś S, et al. Among authors: paprocki k.
Materials (Basel). 2020 Aug 10;13(16):3530. doi: 10.3390/ma13163530.
Materials (Basel). 2020.
PMID: 32785097
Free PMC article.
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Orientation Dependence of Cathodoluminescence and Photoluminescence Spectroscopy of Defects in Chemical-Vapor-Deposited Diamond Microcrystal.
Fabisiak K, Łoś S, Paprocki K, Szybowicz M, Winiecki J, Dychalska A.
Fabisiak K, et al. Among authors: paprocki k.
Materials (Basel). 2020 Nov 29;13(23):5446. doi: 10.3390/ma13235446.
Materials (Basel). 2020.
PMID: 33260474
Free PMC article.
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The Undoped Polycrystalline Diamond Film-Electrical Transport Properties.
Łoś S, Fabisiak K, Paprocki K, Szybowicz M, Dychalska A.
Łoś S, et al. Among authors: paprocki k.
Sensors (Basel). 2021 Sep 12;21(18):6113. doi: 10.3390/s21186113.
Sensors (Basel). 2021.
PMID: 34577318
Free PMC article.
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The Barrier's Heights and Its Inhomogeneities on Diamond Silicon Interfaces.
Łoś S, Fabisiak K, Paprocki K, Kozera W, Knapowski T, Szybowicz M, Dychalska A.
Łoś S, et al. Among authors: paprocki k.
Materials (Basel). 2022 Aug 26;15(17):5895. doi: 10.3390/ma15175895.
Materials (Basel). 2022.
PMID: 36079275
Free PMC article.
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The molecular structure ordering and orientation of the metallophthalocyanine CoPc, ZnPc, CuPc, and MgPc thin layers deposited on silicon substrate, as studied by micro-Raman spectroscopy.
Szybowicz M, Bała W, Fabisiak K, Paprocki K, Drozdowski M.
Szybowicz M, et al. Among authors: paprocki k.
J Mater Sci. 2011;46(20):6589-6595. doi: 10.1007/s10853-011-5607-4. Epub 2011 Oct 1.
J Mater Sci. 2011.
PMID: 36039375
Free PMC article.
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Investigation of Si-Au vicinal surfaces using scanning tunnelling microscopy and reflection high-energy electron diffraction.
Mazurek P, Paprocki K, Mitura Z.
Mazurek P, et al. Among authors: paprocki k.
J Microsc. 2006 Oct;224(Pt 1):125-7. doi: 10.1111/j.1365-2818.2006.01686.x.
J Microsc. 2006.
PMID: 17100924
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In situ characterization of epitaxially grown thin layers.
Mitura Z, Mazurek P, Paprocki K, Mikolajczak P, Beeby JL.
Mitura Z, et al. Among authors: paprocki k.
Phys Rev B Condens Matter. 1996 Apr 15;53(15):10200-10208. doi: 10.1103/physrevb.53.10200.
Phys Rev B Condens Matter. 1996.
PMID: 9982588
No abstract available.
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