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Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction.
Microscopy (Oxf). 2021 Aug 9;70(4):394-397. doi: 10.1093/jmicro/dfab002.
Microscopy (Oxf). 2021.
PMID: 33449081
In situ observation of the chemical bonding state of Si in the molten state of eutectic Au-Si alloy of Au81Si19 by using a soft X-ray emission spectroscopy electron microscope.
Terauchi M, Umemoto N, K Sato Y, Ageishi M, Tsai AP.
Terauchi M, et al. Among authors: ageishi m.
Microscopy (Oxf). 2022 Jan 29;71(1):34-40. doi: 10.1093/jmicro/dfab029.
Microscopy (Oxf). 2022.
PMID: 34302725
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