Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Search Results
3 results
Filters applied: . Clear all
Results are displayed in a computed author sort order.
The Results By Year timeline is not available.
Page 1
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene.
J Vac Sci Technol A. 2020 Dec;38(6):063208. doi: 10.1116/6.0000577. Epub 2020 Nov 23.
J Vac Sci Technol A. 2020.
PMID: 33281279
Free PMC article.
New directions in the analysis of buried interfaces for device technology by hard X-ray photoemission.
Renault O, Deleuze PM, Courtin J, Bure TR, Gauthier N, Nolot E, Robert-Goumet C, Pauly N, Martinez E, Artyushkova K.
Renault O, et al. Among authors: nolot e.
Faraday Discuss. 2022 Aug 25;236(0):288-310. doi: 10.1039/d1fd00110h.
Faraday Discuss. 2022.
PMID: 35543197
Review.
Item in Clipboard
A novel 2-step ALD route to ultra-thin MoS2 films on SiO2 through a surface organometallic intermediate.
Cadot S, Renault O, Frégnaux M, Rouchon D, Nolot E, Szeto K, Thieuleux C, Veyre L, Okuno H, Martin F, Quadrelli EA.
Cadot S, et al. Among authors: nolot e.
Nanoscale. 2017 Jan 5;9(2):538-546. doi: 10.1039/c6nr06021h.
Nanoscale. 2017.
PMID: 27762415
Item in Clipboard
Cite
Cite