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Gas-solid interface charge tailoring techniques: what we grasped and where to go.
Nanotechnology. 2021 Mar 19;32(12):122001. doi: 10.1088/1361-6528/abccea.
Nanotechnology. 2021.
PMID: 33227724
Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process.
Villeneuve-Faure C, Makasheva K, Boudou L, Teyssedre G.
Villeneuve-Faure C, et al. Among authors: teyssedre g.
Nanotechnology. 2016 Jun 17;27(24):245702. doi: 10.1088/0957-4484/27/24/245702. Epub 2016 May 9.
Nanotechnology. 2016.
PMID: 27158768
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Influence of dielectric layer thickness on charge injection, accumulation and transport phenomena in thin silicon oxynitride layers: a nanoscale study.
Mortreuil F, Boudou L, Makasheva K, Teyssedre G, Villeneuve-Faure C.
Mortreuil F, et al. Among authors: teyssedre g.
Nanotechnology. 2021 Feb 5;32(6):065706. doi: 10.1088/1361-6528/abc38a.
Nanotechnology. 2021.
PMID: 33086199
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Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms.
Makasheva K, Villeneuve-Faure C, Laurent C, Despax B, Boudou L, Teyssedre G.
Makasheva K, et al. Among authors: teyssedre g.
Nanotechnology. 2015 Jul 24;26(29):295704. doi: 10.1088/0957-4484/26/29/295704. Epub 2015 Jul 2.
Nanotechnology. 2015.
PMID: 26133237
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Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements.
Villeneuve-Faure C, Boudou L, Makasheva K, Teyssedre G.
Villeneuve-Faure C, et al. Among authors: teyssedre g.
Nanotechnology. 2017 Dec 15;28(50):505701. doi: 10.1088/1361-6528/aa9839.
Nanotechnology. 2017.
PMID: 29099719
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Measurement setup to simultaneously explore the location and energy of trapped charges in thin polymer films.
Mendoza-Lopez D, Berquez L, Boudou L, Teyssedre G.
Mendoza-Lopez D, et al. Among authors: teyssedre g.
Rev Sci Instrum. 2023 Aug 1;94(8):084705. doi: 10.1063/5.0159025.
Rev Sci Instrum. 2023.
PMID: 38065154
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