Class-Wise Denoising for Robust Learning Under Label Noise.
Gong C, Ding Y, Han B, Niu G, Yang J, You J, Tao D, Sugiyama M.
Gong C, et al. Among authors: niu g.
IEEE Trans Pattern Anal Mach Intell. 2023 Mar;45(3):2835-2848. doi: 10.1109/TPAMI.2022.3178690. Epub 2023 Feb 3.
IEEE Trans Pattern Anal Mach Intell. 2023.
PMID: 35635808