Electrical resistance of individual defects at a topological insulator surface.
Lüpke F, Eschbach M, Heider T, Lanius M, Schüffelgen P, Rosenbach D, von den Driesch N, Cherepanov V, Mussler G, Plucinski L, Grützmacher D, Schneider CM, Voigtländer B.
Lüpke F, et al. Among authors: cherepanov v.
Nat Commun. 2017 Jun 12;8:15704. doi: 10.1038/ncomms15704.
Nat Commun. 2017.
PMID: 28604672
Free PMC article.