Barnes JP - Search Results

1

3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX.

Priebe A, Barnes JP, Edwards TEJ, Pethö L, Balogh I, Michler J. Priebe A, et al. Among authors: barnes jp. Anal Chem. 2019 Sep 17;91(18):11834-11839. doi: 10.1021/acs.analchem.9b02545. Epub 2019 Aug 30. Anal Chem. 2019. PMID: 31429257

2

Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX.

Priebe A, Barnes JP, Edwards TEJ, Huszár E, Pethö L, Michler J. Priebe A, et al. Among authors: barnes jp. Anal Chem. 2020 Sep 15;92(18):12518-12527. doi: 10.1021/acs.analchem.0c02361. Epub 2020 Sep 1. Anal Chem. 2020. PMID: 32808520

3

A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography.

Priebe A, Audoit G, Barnes JP. Priebe A, et al. Among authors: barnes jp. Ultramicroscopy. 2017 Feb;173:10-13. doi: 10.1016/j.ultramic.2016.11.010. Epub 2016 Nov 19. Ultramicroscopy. 2017. PMID: 27898297

4

State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography.

Priebe A, Bleuet P, Goret G, Laurencin J, Montinaro D, Barnes JP. Priebe A, et al. Among authors: barnes jp. Microsc Microanal. 2016 Dec;22(6):1261-1269. doi: 10.1017/S1431927616012502. Microsc Microanal. 2016. PMID: 27998367

5

Quantitative profiling of SiGe/Si superlattices by time-of-flight secondary ion mass spectrometry: the advantages of the extended Full Spectrum protocol.

Py M, Barnes JP, Lafond D, Hartmann JM. Py M, et al. Among authors: barnes jp. Rapid Commun Mass Spectrom. 2011 Mar 15;25(5):629-38. doi: 10.1002/rcm.4904. Rapid Commun Mass Spectrom. 2011. PMID: 21290450

6

Identifying exposition to low oxygen environment in human macrophages using secondary ion mass spectrometry and multivariate analysis.

Court M, Barnes JP, Millet A. Court M, et al. Among authors: barnes jp. Rapid Commun Mass Spectrom. 2017 Oct 15;31(19):1623-1632. doi: 10.1002/rcm.7946. Rapid Commun Mass Spectrom. 2017. PMID: 28755479

7

3D analysis of advanced nano-devices using electron and atom probe tomography.

Grenier A, Duguay S, Barnes JP, Serra R, Haberfehlner G, Cooper D, Bertin F, Barraud S, Audoit G, Arnoldi L, Cadel E, Chabli A, Vurpillot F. Grenier A, et al. Among authors: barnes jp. Ultramicroscopy. 2014 Jan;136:185-92. doi: 10.1016/j.ultramic.2013.10.001. Epub 2013 Oct 17. Ultramicroscopy. 2014. PMID: 24189616

8

Quantitative analysis of Si/SiGeC superlattices using atom probe tomography.

Estivill R, Grenier A, Duguay S, Vurpillot F, Terlier T, Barnes JP, Hartmann JM, Blavette D. Estivill R, et al. Among authors: barnes jp. Ultramicroscopy. 2015 Dec;159 Pt 2:223-31. doi: 10.1016/j.ultramic.2015.03.014. Epub 2015 Mar 18. Ultramicroscopy. 2015. PMID: 25814020

9

Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling.

Estivill R, Audoit G, Barnes JP, Grenier A, Blavette D. Estivill R, et al. Among authors: barnes jp. Microsc Microanal. 2016 Jun;22(3):576-82. doi: 10.1017/S1431927616000581. Epub 2016 Apr 8. Microsc Microanal. 2016. PMID: 27056544

10

Dark field electron holography for strain measurement.

Béché A, Rouvière JL, Barnes JP, Cooper D. Béché A, et al. Among authors: barnes jp. Ultramicroscopy. 2011 Feb;111(3):227-38. doi: 10.1016/j.ultramic.2010.11.030. Epub 2010 Nov 30. Ultramicroscopy. 2011. PMID: 21333860

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