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Self-referenced single-electron quantized current source.
Fricke L, Wulf M, Kaestner B, Hohls F, Mirovsky P, Mackrodt B, Dolata R, Weimann T, Pierz K, Siegner U, Schumacher HW. Fricke L, et al. Among authors: schumacher hw. Phys Rev Lett. 2014 Jun 6;112(22):226803. doi: 10.1103/PhysRevLett.112.226803. Epub 2014 Jun 6. Phys Rev Lett. 2014. PMID: 24949784
Semiconductor quantized voltage source.
Hohls F, Welker AC, Leicht Ch, Fricke L, Kaestner B, Mirovsky P, Müller A, Pierz K, Siegner U, Schumacher HW. Hohls F, et al. Among authors: schumacher hw. Phys Rev Lett. 2012 Aug 3;109(5):056802. doi: 10.1103/PhysRevLett.109.056802. Epub 2012 Jul 31. Phys Rev Lett. 2012. PMID: 23006195
Partitioning of on-demand electron pairs.
Ubbelohde N, Hohls F, Kashcheyevs V, Wagner T, Fricke L, Kästner B, Pierz K, Schumacher HW, Haug RJ. Ubbelohde N, et al. Among authors: schumacher hw. Nat Nanotechnol. 2015 Jan;10(1):46-9. doi: 10.1038/nnano.2014.275. Epub 2014 Dec 1. Nat Nanotechnol. 2015. PMID: 25437747
Counting statistics for electron capture in a dynamic quantum dot.
Fricke L, Wulf M, Kaestner B, Kashcheyevs V, Timoshenko J, Nazarov P, Hohls F, Mirovsky P, Mackrodt B, Dolata R, Weimann T, Pierz K, Schumacher HW. Fricke L, et al. Among authors: schumacher hw. Phys Rev Lett. 2013 Mar 22;110(12):126803. doi: 10.1103/PhysRevLett.110.126803. Epub 2013 Mar 20. Phys Rev Lett. 2013. PMID: 25166833
Minimum Resistance Anisotropy of Epitaxial Graphene on SiC.
Momeni Pakdehi D, Aprojanz J, Sinterhauf A, Pierz K, Kruskopf M, Willke P, Baringhaus J, Stöckmann JP, Traeger GA, Hohls F, Tegenkamp C, Wenderoth M, Ahlers FJ, Schumacher HW. Momeni Pakdehi D, et al. Among authors: schumacher hw. ACS Appl Mater Interfaces. 2018 Feb 14;10(6):6039-6045. doi: 10.1021/acsami.7b18641. Epub 2018 Feb 5. ACS Appl Mater Interfaces. 2018. PMID: 29377673
Metrological large range magnetic force microscopy.
Dai G, Hu X, Sievers S, Fernández Scarioni A, Neu V, Fluegge J, Schumacher HW. Dai G, et al. Among authors: schumacher hw. Rev Sci Instrum. 2018 Sep;89(9):093703. doi: 10.1063/1.5035175. Rev Sci Instrum. 2018. PMID: 30278731
36 results